Process-Variation and Temperature Aware SoC Test Scheduling Technique
نویسندگان
چکیده
منابع مشابه
Process-Variation and Temperature Aware SoC Test Scheduling Technique
High temperature and process variation are undesirable phenomena affecting modern Systems-on-Chip (SoC). High temperature is a well-known issue, in particular during test, and should be taken care of in the test process. Modern SoCs are affected by large process variation and therefore experience large and time-variant temperature deviations. A traditional test schedule which ignores these devi...
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High working temperature and process variation are undesirable effects for modern systems-on-chip. The high temperature should be taken care of during the test. On the other hand, large process variations induce rapid and large temperature deviations causing the traditional static test schedules to be suboptimal in terms of speed and/or thermalsafety. A remedy to this problem is an adaptive tes...
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Energy consumption is a major concern in many embedded computing systems. Several studies have shown that cache memories account for about 50% of the total energy consumed in these systems. The performance of a given cache architecture is determined to a large degree by the behavior of the application executing on the architecture. The Desktop systems have to accommodate a very wide range of ap...
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ژورنال
عنوان ژورنال: Journal of Electronic Testing
سال: 2013
ISSN: 0923-8174,1573-0727
DOI: 10.1007/s10836-013-5374-z